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Winterauer, D. J., Funes-Hernando, D., Duvail, J.-L., Moussaoui, S., Batten, T. & Humbert, B. (2019) Sub-Micron Spatial Resolution in Far-Field Raman Imaging Using Positivity-Constrained Super-Resolution. Applied Spectroscopy, 73 902–909. 
Added by: Richard Baschera (2019-08-23 13:33:52)   Last edited by: Richard Baschera (2019-08-23 13:37:31)
Type de référence: Article
DOI: 10.1177/0003702819832355
Clé BibTeX: Winterauer2019
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Créateurs: Batten, Duvail, Funes-Hernando, Humbert, Moussaoui, Winterauer
Collection: Applied Spectroscopy
Consultations : 6/388
Indice de consultation : 4%
Indice de popularité : 1%
Raman microscopy is a valuable tool for detecting physical and chemical properties of a sample material. When probing nanomaterials or nanocomposites the spatial resolution of Raman microscopy is not always adequate as it is limited by the optical diffraction limit. Numerical post-processing with super-resolution algorithms provides a means to enhance resolution and can be straightforwardly applied. The aim of this work is to present interior point least squares (IPLS) as a powerful tool for super-resolution in Raman imaging through constrained optimization. IPLS's potential for super-resolution is illustrated on numerically generated test images. Its resolving power is demonstrated on Raman spectroscopic data of a polymer nanowire sample. Comparison to atomic force microscopy data of the same sample substantiates that the presented method is a promising technique for analyzing nanomaterial samples.
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