IMN

Biblio. IMN

Référence en vue solo

Shi, W., Theelen, M., Gevaerts, V., Illiberi, A., Barreau, N., Butterling, M., Schut, H., Egger, W., Dickmann, M., Hugenschmidt, C., Zeman, M., Bruck, E. & Eijt, S. W. H. (2018) Positron Annihilation Studies on the Damp Heat Degradation of ZnO:Al Transparent Conductive Oxide Layers for CIGS Solar Cells. IEEE J. Photovolt. 8 1847–1851. 
Added by: Richard Baschera (2018-12-20 08:24:17)   Last edited by: Richard Baschera (2018-12-20 08:25:55)
Type de référence: Article
DOI: 10.1109/JPHOTOV.2018.2863788
Numéro d'identification (ISBN etc.): 2156-3381
Clé BibTeX: Shi2018a
Voir tous les détails bibliographiques
Catégories: INTERNATIONAL, MIOPS
Mots-clés: and back contacts, beam, buffer layers, CIGS and CdTe thin film solar cells, Degradation, films, Grain boundaries, positrons, Stability, transparent conductors, ZnO:Al
Créateurs: Barreau, Bruck, Butterling, Dickmann, Egger, Eijt, Gevaerts, Hugenschmidt, Illiberi, Schut, Shi, Theelen, Zeman
Collection: IEEE J. Photovolt.
Consultations : 1/482
Indice de consultation : 5%
Indice de popularité : 1.25%
Résumé     
Positron annihilation depth-profiling is used as an innovative tool to monitor the evolution of vacancy defects in two series of ZnO:Al transparent conductive oxide (TCO) layers for Cu(In,Ga)Se-2 (CIGS) solar cells under accelerated degradation at 85 degrees C/85% relative humidity. The first series of ZnO:Al layers are deposited directly on flat glass substrates, leading to low densities of (extended) grain boundaries in the ZnO:Al. These ZnO:Al layers only show an increase in open volume upon degradation in the near-surface range. The second series of ZnO:Al layers are deposited on the more corrugated surface of CdS/CIGS/Mo solar cells, and show, on the other hand, a pronounced formation of open volume throughout the layer. Its depth-dependence is consistent with in-diffusion of molecules such as H2O and CO2 into the ZnO:Al layer via the grain boundaries, as primary driver for the degradation. The detected time-dependence of the growth of open volume at the grain boundaries in the ZnO:Al TCO layer matches the time scale of the observed reduction in solar cell efficiency and series resistance, suggesting that the generated open volume induces a significant barrier against charge carrier transport.
  
wikindx 4.2.2 ©2014 | Références totales : 2859 | Requêtes métadonnées : 67 | Exécution de script : 0.14739 secs | Style : Harvard | Bibliographie : Bibliographie WIKINDX globale