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Lecuyer, P., Fremont, H., Landesman, J. .-P. & Bahi, M. .-A. (2010) Wearout estimation using the Robustness Validation methodology for components in 150 degrees C ambient automotive applications. Microelectron. Reliab. 50 1744–1749.
Added by: Laurent Cournède (2016-03-10 21:37:31) |
| Type de référence: Article DOI: 10.1016/j.microrel.2010.07.076 Numéro d'identification (ISBN etc.): 0026-2714 Clé BibTeX: Lecuyer2010 Voir tous les détails bibliographiques  |
Catégories: PCM Créateurs: Bahi, Fremont, Landesman, Lecuyer Collection: Microelectron. Reliab. |
Consultations : 1/460
Indice de consultation : 3% Indice de popularité : 0.75% |
| Résumé |
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AEC-Q100 is the usual qualification reference for automotive ICs dedicated to applications up to 125 degrees C ambient temperature. Although qualification criteria have been defined which enable the qualification extension up to 150 degrees C, this might always not satisfy the requirements of automotive Zero Defect policy. The mission profile might for instance exceed the scope of AEC-Q100 verifications, or it might be impossible to predict when the wearout period will start depending on use, having gained very little knowledge of the degradation kinetics. This study provides a concrete analysis of potential customer exposure to wearout failure mechanisms based on the principles developed in SAE J1879 [1], Handbook for Robustness Validation of Semiconductor Devices in Automotive Application. (C) 2010 Elsevier Ltd. All rights reserved.
Added by: Laurent Cournède |