IMN

Biblio. IMN

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Bernede, J. C., Houari, S., Nguyen, D., Jouan, P. Y., Khelil, A., Mokrani, A., Cattin, L. & Predeep, P. (2012) XPS study of the band alignment at ITO/oxide (n-type MoO3 or p-type NiO) interface. Phys. Status Solidi A-Appl. Mat. 209 1291–1297.   
Added by: Laurent Cournède 2016-03-10 21:28:39 Pop. 1%
Han, J., Ouyang, L., Zhuang, D., Liao, C., Liu, J., Zhao, M., Cha, L.-M. & Besland, M. .-P. (2014) Raman and XPS studies of CIGS/Mo interfaces under various annealing temperatures. Mater. Lett. 136 278–281.   
Added by: Laurent Cournède 2016-03-10 21:01:54 Pop. 1.5%
Han, J.-F., Liao, C., Jiang, T., Xie, H.-M., Zhao, K. & Besland, M. .-P. (2014) Investigation of chalcopyrite film growth at various temperatures: Analyses from top to the bottom of the thin films. J. Mater. Sci.-Mater. Electron. 25 2237–2243.   
Added by: Florent Boucher 2016-04-29 09:26:44 Pop. 1%
Han, J.-F., Liao, C., Cha, L.-M., Jiang, T., Xie, H.-M., Zhao, K. & Besland, M. .-P. (2014) TEM and XPS studies on CdS/CIGS interfaces. J. Phys. Chem. Solids, 75 1279–1283.   
Added by: Laurent Cournède 2016-03-10 21:01:54 Pop. 1%
Salimy, S., Challali, F., Goullet, A., Besland, M. .-P., Carette, M., Gautier, N., Rhallabi, A., Landesman, J. P., Toutain, S. & Averty, D. (2013) Electrical Characteristics of TiTaO Thin Films Deposited on SiO2/Si Substrates by Magnetron Sputtering. ECS Solid State Lett. 2 Q13–Q15.   
Added by: Laurent Cournède 2016-03-10 21:23:32 Pop. 0.75%
wikindx 4.2.2 ©2014 | Références totales : 2859 | Requêtes métadonnées : 45 | Exécution de script : 0.09231 secs | Style : Harvard | Bibliographie : Bibliographie WIKINDX globale