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Bargiela, P., Fernandez, V., Ravisy, W., Morgan, D., Richard-Plouet, M., Fairley, N. & Baltrusaitis, J. (2024) Surface Analysis Insight Note: Observations relating to photoemission peak shapes, oxidation state, and chemistry of titanium oxide films. Surface and Interface Analysis, |
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Bargiela, P., Fernandez, V., Cardinaud, C., Walton, J., Greiner, M., Morgan, D., Fairley, N. & Baltrusaitis, J. (2021) Towards a reliable assessment of charging effects during surface analysis: Accurate spectral shapes of ZrO2 and Pd/ZrO2 via X-ray Photoelectron Spectroscopy. Applied Surface Science, 566 150728. |
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Challali, F., Besland, M. P., Benzeggouta, D., Borderon, C., Hugon, M. C., Salimy, S., Saubat, J. C., Charpentier, A., Averty, D., Goullet, A. & Landesman, J. P. (2010) Investigation of BST thin films deposited by RF magnetron sputtering in pure Argon. Thin Solid Films, 518 4619–4622. |
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El Mel, A. A., Gautron, E., Christien, F., Angleraud, B., Granier, A., Soucek, P., Vasina, P., Bursikova, V., Takashima, M., Ohtake, N., Akasaka, H., Suzuki, T. & Tessier, P. Y. (2014) Titanium carbide/carbon nanocomposite hard coatings: A comparative study between various chemical analysis tools. Surf. Coat. Technol. 256 41–46. |
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El Mel, A. A., Angleraud, B., Gautron, E., Granier, A. & Tessier, P. Y. (2011) XPS study of the surface composition modification of nc-TiC/C nanocomposite films under in situ argon ion bombardment. Thin Solid Films, 519 3982–3985. |
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Fairley, N., Fernandez, V., Richard‐Plouet, M., Guillot-Deudon, C., Walton, J., Smith, E., Flahaut, D., Greiner, M., Biesinger, M., Tougaard, S., Morgan, D. & Baltrusaitis, J. (2021) Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy. Applied Surface Science Advances, 5 100112. |
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Girard, A., Coulon, N., Cardinaud, C., Mohammed-Brahim, T. & Geneste, F. (2014) Effect of doping on the modification of polycrystalline silicon by spontaneous reduction of diazonium salts. Appl. Surf. Sci. 314 358–366. |
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Han, J., Ouyang, L., Zhuang, D., Liao, C., Liu, J., Zhao, M., Cha, L.-M. & Besland, M. .-P. (2014) Raman and XPS studies of CIGS/Mo interfaces under various annealing temperatures. Mater. Lett. 136 278–281. |
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Keraudy, J., Ferrec, A., Richard-Plouet, M., Hamon, J., Goullet, A. & Jouan, P.-Y. (2017) Nitrogen doping on NiO by reactive magnetron sputtering: A new pathway to dynamically tune the optical and electrical properties. Appl. Surf. Sci. 409 77–84. |
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Minea, T. M., Bouchet-Fabre, B., Lazar, S., Point, S. & Zandbergen, H. W. (2006) Angular and local spectroscopic analysis to probe the vertical alignment of N-doped well-separated carbon nanotubes. J. Phys. Chem. B, 110 15659–15662. |
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Rouahi, A., Challali, F., Dakhlaoui, I., Vallee, C., Salimy, S., Jomni, F., Yangui, B., Besland, M. P., Goullet, A. & Sylvestre, A. (2016) Structural and dielectric characterization of sputtered Tantalum Titanium Oxide thin films for high temperature capacitor applications. Thin Solid Films, 606 127–132. |
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