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Fernandez, V., Fairley, N. & Baltrusaitis, J. (2023) Surface analysis insight note: Synthetic line shapes, integration regions and relative sensitivity factors. Surface and Interface Analysis, 55 3–9. 
Added by: Richard Baschera (2022-10-28 09:22:05)   Last edited by: Richard Baschera (2023-11-22 18:05:50)
Type de référence: Article
DOI: 10.1002/sia.7155
Numéro d'identification (ISBN etc.): 0142-2421
Clé BibTeX: Fernandez2023a
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Créateurs: Baltrusaitis, Fairley, Fernandez
Collection: Surface and Interface Analysis
Consultations : 4/185
Indice de consultation : 7%
Indice de popularité : 1.75%
Methods for estimating photoemission intensity from X-ray photoelectron spectroscopy data are examined. The role played by ``synthetic{''} bell-shaped curves, integration intervals, background curves, and the use of relative sensitivity factors (RSFs) in reporting percentage atomic concentration for a sample is presented. In particular, photoemission lines with differing energy distributions obtained from the NaCl sample surface are used to demonstrate how a comparison of photoemission intensities is dependent on the line shapes, background curves, and appropriate use of RSFs.
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