Biblio. IMN

Référence en vue solo

Nguyen, D. .-T., Vedraine, S., Cattin, L., Torchio, P., Morsli, M., Flory, F. & Bernede, J. C. (2012) Effect of the thickness of the MoO3 layers on optical properties of MoO3/Ag/MoO3 multilayer structures. J. Appl. Phys. 112 063505. 
Added by: Laurent Cournède (2016-03-10 21:28:38)
Type de référence: Article
DOI: 10.1063/1.4751334
Numéro d'identification (ISBN etc.): 0021-8979
Clé BibTeX: Nguyen2012a
Voir tous les détails bibliographiques
Catégories: CESES
Mots-clés: Anode, Electrodes, organic solar-cells, surface-plasmon, thin-films, transparent
Créateurs: Bernede, Cattin, Flory, Morsli, Nguyen, Torchio, Vedraine
Collection: J. Appl. Phys.
Consultations : 8/419
Indice de consultation : 2%
Indice de popularité : 0.5%
{The electrical and optical properties of MoO3/Ag/MoO3 multilayer structures have been studied using the Ag deposition rate and layer thicknesses as parameters. When the silver film is deposited at 0.20 nm/s rate, the silver layer thickness necessary to achieve the percolation threshold of the resistivity rho towards conductive structures is 10 nm. Below 10 nm, the films are semiconductor and above the films are conductors. In the present work, the variation of the thicknesses of top and bottom MoO3 layers is shown to strongly modify the optical properties of the multilayer structures. By using a Ag thickness of 10 nm, we demonstrate an increasing of the transmittance of the MoO3/Ag/MoO3 structures by optimizing the MoO3 layers thicknesses. When the MoO3 bottom layer is 20 nm thick, and the MoO3 top layer is 35 nm, the maximum transmission is 86\% at the wavelength of 465 nm, while the averaged transmission in the visible range (350 nm-800 nm) is 70\%. The best measured conductivity
Added by: Laurent Cournède  
wikindx 4.2.2 ©2014 | Références totales : 2608 | Requêtes métadonnées : 59 | Exécution de script : 0.11434 secs | Style : Harvard | Bibliographie : Bibliographie WIKINDX globale