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Baer, M., Klaer, J., Felix, R., Barreau, N., Weinhardt, L., Wilks, R. G., Heske, C. & Schock, H.-W. (2013) Surface Off-Stoichiometry of CuInS2 Thin-Film Solar Cell Absorbers. 2012 Ieee 38th Photovoltaic Specialists Conference (pvsc), Vol 2 New York. 
Added by: Richard Baschera (2016-03-10 21:23:32)   Last edited by: Richard Baschera (2016-05-19 15:21:23)
Type de référence: Chapitre/Section
Clé BibTeX: Baer2013a
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Catégories: CESES, INTERNATIONAL
Mots-clés: Chalcopyrite thin-film solar cell, efficiency, Surface composition, wet-chemical treatment, X-ray photoelectron spectroscopy
Créateurs: Baer, Barreau, Felix, Heske, Klaer, Schock, Weinhardt, Wilks
Éditeur: Ieee (New York)
Collection: 2012 {Ieee} 38th {Photovoltaic} {Specialists} {Conference} (pvsc), {Vol} 2
Consultations : 8/388
Indice de consultation : 1%
Indice de popularité : 0.25%
Résumé     
X-ray photoelectron and x-ray-excited Auger electron spectroscopy was used to investigate the chemical surface structure of CuInS2 thin-film solar cell absorbers. We find that the [In)/[Cu) surface composition can vary between 1.6 (+/- 0.4) and 3.7 (+/- 0.7), depending on relatively minor variations in the absorber formation process and/or whether additional wet-chemical treatments are performed. These variations are primarily due to differences in the Cu surface concentration. The corresponding change of the modified In Auger parameter is interpreted as being indicative for a change of the chemical environment of In as a function of Cu off-stoichiometry.
  
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