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Baer, M., Klaer, J., Felix, R., Barreau, N., Weinhardt, L., Wilks, R. G., Heske, C. & Schock, H.-W. (2013) Surface Off-Stoichiometry of CuInS2 Thin-Film Solar Cell Absorbers. IEEE J. Photovolt. 3 828–832. 
Added by: Laurent Cournède (2016-03-10 21:23:31)
Type de référence: Article
DOI: 10.1109/JPHOTOV.2012.2228299
Numéro d'identification (ISBN etc.): 2156-3381
Clé BibTeX: Baer2013
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Mots-clés: Chalcopyrite thin-film solar cell, cu(in, efficiency, ga)(s, impact, layers, performance, se)(2), Surface composition, wet-chemical treatment, X-ray photoelectron spectroscopy
Créateurs: Baer, Barreau, Felix, Heske, Klaer, Schock, Weinhardt, Wilks
Collection: IEEE J. Photovolt.
Consultations : 2/590
Indice de consultation : 4%
Indice de popularité : 1%
In this paper, X-ray photoelectron and X-ray-excited Auger electron spectroscopy was used to investigate the chemical surface structure of CuInS2 thin-film solar cell absorbers. We find that the [In]/[Cu]surface composition can vary between 1.6 (+/- 0.4) and 3.7 (+/- 0.7), depending on relatively minor variations in the absorber formation process and/or whether additional wet-chemical treatments are performed. These variations are primarily due to differences in the Cu surface concentration. The corresponding change of the modified In Auger parameter is interpreted as being indicative of a change in the chemical environment of In as a function of Cu off-stoichiometry.
Added by: Laurent Cournède  
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