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Baltrusaitis, J., Mendoza-Sanchez, B., Fernandez, V., Veenstra, R., Dukstiene, N., Roberts, A. & Fairley, N. (2015) Generalized molybdenum oxide surface chemical state XPS determination via informed amorphous sample model. Appl. Surf. Sci. 326 151–161. 
Added by: Laurent Cournède (2016-03-10 18:36:42)
Type de référence: Article
DOI: 10.1016/j.apsusc.2014.11.077
Numéro d'identification (ISBN etc.): 0169-4332
Clé BibTeX: Baltrusaitis2015
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Catégories: IMN
Mots-clés: alpha-moo3, catalysts, Electrochemical properties, Informed amorphous sample model, Molybdenum oxide, MoO3, oxidation, peak-parameter errors, ray photoelectron-spectroscopy, Spectra envelope, standard test data, thermal reduction, thin-films, X-ray photoelectron spectrometry
Créateurs: Baltrusaitis, Dukstiene, Fairley, Fernandez, Mendoza-Sanchez, Roberts, Veenstra
Collection: Appl. Surf. Sci.
Consultations : 12/492
Indice de consultation : 2%
Indice de popularité : 0.5%
Résumé     
Accurate elemental oxidation state determination for the outer surface of a complex material is of crucial importance in many science and engineering disciplines, including chemistry, fundamental and applied surface science, catalysis, semiconductors and many others. X-ray photoelectron spectroscopy (XPS) is the primary tool used for this purpose. The spectral data obtained, however, is often very complex and can be subject to incorrect interpretation. Unlike traditional XPS spectra fitting procedures using purely synthetic spectral components, here we develop and present an XPS data processing method based on vector analysis that allows creating XPS spectral components by incorporating key information, obtained experimentally. XPS spectral data, obtained from series of molybdenum oxide samples with varying oxidation states and degree of crystallinity, were processed using this method and the corresponding oxidation states present, as well as their relative distribution was elucidated. It was shown that monitoring the evolution of the chemistry and crystal structure of a molybdenum oxide sample due to an invasive X-ray probe could be used to infer solutions to complex spectral envelopes. (C) 2014 Elsevier B.V. All rights reserved.
Added by: Laurent Cournède  
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