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Couzinie-Devy, F., Cadel, E., Barreau, N., Arzel, L. & Pareige, P. (2015) Na distribution in Cu(In,Ga)Se-2 thin films: Investigation by atom probe tomography. Scr. Mater. 104 83–86. 
Added by: Laurent Cournède (2016-03-10 18:36:41)
Type de référence: Article
DOI: 10.1016/j.scriptamat.2015.03.028
Numéro d'identification (ISBN etc.): 1359-6462
Clé BibTeX: CouzinieDevy2015
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Catégories: CESES
Mots-clés: Atom probe tomography, cu(in, cuin1-xgaxse2, cuinse2, ga)se-2, Sodium, Solar cells
Créateurs: Arzel, Barreau, Cadel, Couzinie-Devy, Pareige
Collection: Scr. Mater.
Consultations : 16/403
Indice de consultation : 2%
Indice de popularité : 0.5%
Résumé     
Atom probe tomography (APT) has been used to study the distribution of Na atoms in polycrystalline Cu(In,Ga)Se-2 (CIGSe) thin films. APT, which allows separate investigations of grain boundaries and grain interiors chemistry, shows the presence of inter- and intra-granular Na segregations. It is highlighted that these segregations are found associated to Cu-depletion and In-enrichment. The segregation of Na to crystalline point defects and extended ones is finally discussed regarding its impact on the electrical properties of CIGSe layers. (C) 2015 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
Added by: Laurent Cournède  
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