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Moeini, B., Linford, M. R., Fairley, N., Barlow, A., Cumpson, P., Morgan, D., Fernandez, V. & Baltrusaitis, J. (2021) Definition of a new (Doniach-Sunjic-Shirley) peak shape for fitting asymmetric signals applied to reduced graphene oxide/graphene oxide XPS spectra. Surface and Interface Analysis, n/a.
Added by: Richard Baschera (2021-11-04 14:39:20) Last edited by: Richard Baschera (2021-11-04 14:42:28) |
| Type de référence: Article DOI: 10.1002/sia.7021 Numéro d'identification (ISBN etc.): 1096-9918 Clé BibTeX: Moeini2021a Voir tous les détails bibliographiques  |
Catégories: IMN, INTERNATIONAL Mots-clés: Data processing, Graphene oxide, peak shape, reduced graphene oxide, XPS Créateurs: Baltrusaitis, Barlow, Cumpson, Fairley, Fernandez, Linford, Moeini, Morgan Collection: Surface and Interface Analysis |
Consultations : 11/296
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| Liens URLs https://onlinelibr ... s/10.1002/sia.7021 |
| Résumé |
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The existence of asymmetry in X-ray photoelectron spectroscopy (XPS) photoemission lines is widely accepted, but line shapes designed to accommodate asymmetry are generally lacking in theoretical justification. In this work, we present a new line shape for describing asymmetry in XPS signals that is based on two facts. First, the most widely known line shape for fitting asymmetric XPS signals that has a theoretical basis, referred to as the Doniach-Sunjic (DS) line shape, suffers from a mathematical inconvenience, which is that for asymmetric shapes the area beneath the curve (above the x-axis) is infinite. Second, it is common practice in XPS to remove the inelastically scattered background response of a peak in question with the Shirley algorithm. The new line shape described herein attempts to retain the theoretical virtues of the DS line shape, while allowing the use of a Shirley background, with the consequence that the resulting line shape has a finite area. To illustrate the use of this Doniach-Sunjic-Shirley (DSS) line shape, a set of spectra obtained from varying amounts of graphene oxide (GO) and reduced GO on a patterned, heterogeneous surface are fit and discussed.
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| Notes |
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_eprint: https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/pdf/10.1002/sia.7021
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