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D'Orlando, A., Mevellec, J.-Y., Louarn, G. & Humbert, B. (2020) Atomic Force Microscopy Nanomanipulation by Confocal Raman Multiwavelength Spectroscopy: Application at the Monitoring of Resonance Profile Excitation Changes of Manipulated Carbon Nanotube. J. Phys. Chem. C, 124 2705–2711. 
Added by: Richard Baschera (2020-02-24 14:32:42)   Last edited by: Richard Baschera (2020-02-24 16:48:52)
Type de référence: Article
DOI: 10.1021/acs.jpcc.9b10096
Numéro d'identification (ISBN etc.): 1932-7447
Clé BibTeX: DOrlando2020
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Catégories: ID2M, IMN, PMN
Mots-clés: approximation, Defects, graphene
Créateurs: D'Orlando, Humbert, Louarn, Mevellec
Collection: J. Phys. Chem. C
Consultations : 9/236
Indice de consultation : 3%
Indice de popularité : 0.75%
Résumé     
This paper explores the possibilities offered by coupling C nanomanipulation with resonance Raman excitation profile approaches. We apply this method to nanostructures produced by AFM nanomanipulation. The experimental demonstration is made on the interaction between two single-wall carbon nanotubes, one semiconducting and the other metallic. The measurement is analyzed and discussed in terms of resonance shifts and broadening of the electronic transition. This paper focuses on the example of the interaction between one (18,0) metallic SWCNT with one (11,9) semiconductor SWCNT. Our experimental setup allows to measure the evolution of resonance width from 75 cm(-1) to 100 cm(-1) for an isolated carbon nanotube (CNT), to more than 200 cm(-1) for interacting CNTs.
  
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