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Raza, M., Sanna, S., dos Santos Gomez, L., Gautron, E., El Mel, A. A., Pryds, N., Snyders, R., Konstantinidis, S. & Esposito, V. (2018) Near interface ionic transport in oxygen vacancy stabilized cubic zirconium oxide thin films. Phys. Chem. Chem. Phys. 20 26068–26071. 
Added by: Richard Baschera (2018-12-20 08:24:17)   Last edited by: Richard Baschera (2018-12-20 08:31:26)
Type de référence: Article
DOI: 10.1039/c8cp05465g
Numéro d'identification (ISBN etc.): 1463-9076
Clé BibTeX: Raza2018
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Catégories: IMN, INTERNATIONAL, PCM
Mots-clés: Conductivity, fuel-cells, nanoionics, solid electrolytes, strain, systems
Créateurs: El Mel, Esposito, Gautron, Konstantinidis, Pryds, Raza, Sanna, dos Santos Gomez, Snyders
Collection: Phys. Chem. Chem. Phys.
Consultations : 9/277
Indice de consultation : 3%
Indice de popularité : 0.75%
Résumé     
The cubic phase of pure zirconia (ZrO2) is stabilized in dense thin films through a controlled introduction of oxygen vacancies (O defects) by cold-plasma-based sputtering deposition. Here, we show that the cubic crystals present at the film/substrate interface near-region exhibit fast ionic transport, which is superior to what is obtained with similar yttrium-stabilized cubic zirconia thin films.
  
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