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Raza, M., Sanna, S., dos Santos Gomez, L., Gautron, E., El Mel, A. A., Pryds, N., Snyders, R., Konstantinidis, S. & Esposito, V. (2018) Near interface ionic transport in oxygen vacancy stabilized cubic zirconium oxide thin films. Phys. Chem. Chem. Phys. 20 26068–26071.
Added by: Richard Baschera (2018-12-20 08:24:17) Last edited by: Richard Baschera (2018-12-20 08:31:26) |
| Type de référence: Article DOI: 10.1039/c8cp05465g Numéro d'identification (ISBN etc.): 1463-9076 Clé BibTeX: Raza2018 Voir tous les détails bibliographiques  |
Catégories: IMN, INTERNATIONAL, PCM Mots-clés: Conductivity, fuel-cells, nanoionics, solid electrolytes, strain, systems Créateurs: El Mel, Esposito, Gautron, Konstantinidis, Pryds, Raza, Sanna, dos Santos Gomez, Snyders Collection: Phys. Chem. Chem. Phys. |
Consultations : 1/413
Indice de consultation : 4% Indice de popularité : 1% |
| Résumé |
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The cubic phase of pure zirconia (ZrO2) is stabilized in dense thin films through a controlled introduction of oxygen vacancies (O defects) by cold-plasma-based sputtering deposition. Here, we show that the cubic crystals present at the film/substrate interface near-region exhibit fast ionic transport, which is superior to what is obtained with similar yttrium-stabilized cubic zirconia thin films.
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