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Bechu, S., Humbert, B., Fernandez, V., Fairley, N. & Richard-Plouet, M. (2018) Vectorial method used to monitor an evolving system: Titanium oxide thin films under UV illumination. Applied Surface Science, 447 528–534. 
Added by: Richard Baschera (2018-07-17 08:58:09)   Last edited by: Richard Baschera (2018-07-24 13:53:27)
Type de référence: Article
DOI: 10.1016/j.apsusc.2018.03.199
Numéro d'identification (ISBN etc.): 0169-4332
Clé BibTeX: Bechu2018
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Catégories: IMN, INTERNATIONAL, PCM, PMN
Créateurs: Bechu, Fairley, Fernandez, Humbert, Richard-Plouet
Collection: Applied Surface Science
Consultations : 3/372
Indice de consultation : 2%
Indice de popularité : 0.5%
Résumé     
Under in situ UV illumination, some materials present evolution of their opto-electronic properties that can be monitored by spectroscopy. We present here a mathematical method which can be applied to spectroscopic measurements when an evolving set of data is recorded: the vectorial method. The investigations and quantifications are performed by Infrared spectroscopy and XPS on organic-inorganic thin films prepared by sol- gel. The inorganic part of these hybrid thin films contains Ti oxide-network based whereas the organic part is composed of N, N-dimethylformamide and its hydrolysis products. Under UV illumination, those films exhibit intermediate bandgap behavior due to the photoreduction of Ti(IV) in Ti (III). The role of the solvent in the thin film is underlined during the process of photoreduction together with an understanding of the condensation of the Ti oxide-based network, as these evolutions are critical for the opto-electronic properties of those thin films. (C) 2018 Elsevier B.V. All rights reserved.
  
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