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Sellier, D. & Stephant, N. (2017) Submicrometric metrology applied to SEM characterization of erosion processes on quartz and quartzites. Geomorphologie-Relief Processus Environnement, 23 51–81.
Added by: Richard Baschera (2017-07-10 13:32:18) Last edited by: Richard Baschera (2017-07-10 13:34:50) |
| Type de référence: Article DOI: 10.4000/geomorphologie.11660 Numéro d'identification (ISBN etc.): 1266-5304 Clé BibTeX: Sellier2017 Voir tous les détails bibliographiques  |
Catégories: IMN Créateurs: Sellier, Stephant Collection: Geomorphologie-Relief Processus Environnement |
Consultations : 1/492
Indice de consultation : 4% Indice de popularité : 1% |
| Résumé |
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Exoscopy is the analysis of the surface of mineral objects by scanning electron microscopy. It is applied to the erosion marks recorded by grains of sand or rock fragments, particularly those formed from quartz, and thus provides an additional level of observation in geomorphology. In this field, submicrometric metrology software represents an innovative tool due to its abilities to construct three-dimensional images of microreliefs, such as maps, topographic profiles and block diagrams, and to enhance the characterization of surfaces by the calculation of roughness indices. As an example, this tool is applied here to marks resulting from wind corrasion, glacial abrasion, coastal erosion and chemical change, on four series of samples of rock fragments and gravels constituted of quartz or quartzite. It is presented as a mean of analyzing, illustrating and measuring forms of erosion, as a procedure for characterizing and comparing surfaces, and as an additional source of information about the processes involved.
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