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Albrithen, H. A., Elnaggar, M., Ozga, K., Szota, M., Alahmed, Z. A., Alanazi, A. Q., Alshahrani, H., Alfaifi, E., Djouadi, M. A. & Labis, J. P. (2017) Structural transition in SrZnO laser pulse deposited alloy. Arch. Metall. Mater. 62 211–216. 
Added by: Richard Baschera (2017-05-05 13:45:23)   Last edited by: Richard Baschera (2017-05-05 13:46:07)
Type de référence: Article
DOI: 10.1515/amm-2017-0030
Numéro d'identification (ISBN etc.): 1733-3490
Clé BibTeX: Albrithen2017
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Mots-clés: Band-gap, barium oxide, doped zno films, mgxzn1-xo, molecular-beam epitaxy, multiquantum wells, optical-properties, oxide materials, quantum-wells, Scanning electron microscopy, solid state alloys, structural phase transitions, thin-films, X-ray diffraction, zinc-oxide
Créateurs: Alahmed, Alanazi, Albrithen, Alfaifi, Alshahrani, Djouadi, Elnaggar, Labis, Ozga, Szota
Collection: Arch. Metall. Mater.
Consultations : 8/786
Indice de consultation : 5%
Indice de popularité : 1.25%
We have discovered a structural transition for the SrZnO alloy films from a wurtzite to a rock-salt structure, leading to a reduction in the (1120)/(0001) surface energy ratio. The films were grown by pulsed laser deposition using different SrO ratios, x. We have revealed that growth at a higher temperature, 750 degrees C, resulted in a sharp 0002 peak at a low SrO content (5%), whereas growth at a higher SrO content (10%) resulted in a non-crystalline film with minute crystallites with a (1120) orientation. Generally the crystallinity decreased as the SrO content increased. No results obtained for the crystalline films showed any orientation of significant peaks besides the peak attributed to the (0001) plane, suggesting epitaxial growth. Optical measurements showed difference in transmission widows of alloys with different SrO percentage, and this was correlated to SrO influence on growth mode as indicated by scanning electron imaging. The studied SrZnO films, with SrO/(SrO + ZnO) {<}= 0.25, were grown by pulsed laser deposition using different SrO ratios, x. The effects of temperature and oxygen pressure during growth on the films' structural properties were investigated. XRD results indicate that the film crystallinity was improved as the temperature and O-2 pressure increased up to 650 degrees C and 0.5 Torr, respectively.
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