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Schneegans, O., Moradpour, A., Wang, K., LeBlanc, A. & Molinie, P. (2006) Conducting-probe AFM nanoscale joule heating yields charge-density-wave transition detection. J. Phys. Chem. B, 110 9991–9994.
Added by: Florent Boucher (2016-05-12 13:21:37) |
| Type de référence: Article DOI: 10.1021/jp060871g Numéro d'identification (ISBN etc.): 1520-6106 Clé BibTeX: Schneegans2006 Voir tous les détails bibliographiques  |
Catégories: IMN Mots-clés: 1t-tase2, atomic-force microscopy, films, metal dichalcogenides, nanometer-scale symbols, phase-change, scanning tunneling microscope, storage, tas2 Créateurs: LeBlanc, Molinie, Moradpour, Schneegans, Wang Collection: J. Phys. Chem. B |
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Several layered transition-metal dichalcogenides are studied using conducting probe AFM aiming to investigate the probe-mediated thermal processes likely to arise in the probe-substrate vicinity due to the high-current densities involved. A signature of local heating is found in the shape of current-potential (i/V) curves. The latter allows straightforward detection of a charge-density-wave (CDW) transition for 1T-TaSe2 samples exhibiting it above room temperature. This is an illustration of a new use of conducting probe AFM to investigate solid-state bulk characteristics owing to a distinctive nanoscale Joule heating.
Added by: Florent Boucher |