Biblio. IMN

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Schneegans, O., Moradpour, A., Wang, K., LeBlanc, A. & Molinie, P. (2006) Conducting-probe AFM nanoscale joule heating yields charge-density-wave transition detection. J. Phys. Chem. B, 110 9991–9994. 
Added by: Florent Boucher (2016-05-12 13:21:37)
Type de référence: Article
DOI: 10.1021/jp060871g
Numéro d'identification (ISBN etc.): 1520-6106
Clé BibTeX: Schneegans2006
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Catégories: IMN
Mots-clés: 1t-tase2, atomic-force microscopy, films, metal dichalcogenides, nanometer-scale symbols, phase-change, scanning tunneling microscope, storage, tas2
Créateurs: LeBlanc, Molinie, Moradpour, Schneegans, Wang
Collection: J. Phys. Chem. B
Consultations : 2/413
Indice de consultation : 2%
Indice de popularité : 0.5%
Several layered transition-metal dichalcogenides are studied using conducting probe AFM aiming to investigate the probe-mediated thermal processes likely to arise in the probe-substrate vicinity due to the high-current densities involved. A signature of local heating is found in the shape of current-potential (i/V) curves. The latter allows straightforward detection of a charge-density-wave (CDW) transition for 1T-TaSe2 samples exhibiting it above room temperature. This is an illustration of a new use of conducting probe AFM to investigate solid-state bulk characteristics owing to a distinctive nanoscale Joule heating.
Added by: Florent Boucher  
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