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Nguyen, T. P., Ip, J., Renaud, C., Huang, C. H., Guillen, C. & Herrero, J. (2006) Study of the interface formed between poly (2-methoxy-5-(2 '-ethyl-hexyloxyl)-p-phenylene vinylene) and indium tin oxide in top emission organic light emitting diodes. Appl. Surf. Sci. 252 8388–8393. 
Added by: Florent Boucher (2016-05-12 13:21:36)
Type de référence: Article
DOI: 10.1016/j.apsusc.2005.10.065
Numéro d'identification (ISBN etc.): 0169-4332
Clé BibTeX: Nguyen2006
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Catégories: PMN
Mots-clés: chemical interaction, deposition, devices, diffusion, ito thin-films, meh-ppv, optical-properties, photoelectron-spectroscopy, polymer-ITO interface, Stability, temperature, TOLEDs, X-ray photoelectron spectroscopy, XPS
Créateurs: Guillen, Herrero, Huang, Ip, Nguyen, Renaud
Collection: Appl. Surf. Sci.
Consultations : 3/414
Indice de consultation : 1%
Indice de popularité : 0.25%
Résumé     
X-ray photoelectron spectroscopy (XPS) technique have been used to investigate the interface formed between poly(2-methoxy-5-(2'-ethylhexyloxyl)-p-phenylene vinylene) (MEH-PPV) and indium tin oxide (ITO) layer in top emission organic light emitting diodes. A weak but noticeable diffusion of indium into the polymer film was observed. Interactions between the diffused metallic atoms with the polymer resulted in the formation of carbon-metal complexes at the interface region. Compared to the ITO/MEH-PPV interface, the penetration of indium into the polymer layer was less important and may be explained by the surface morphology of the polymer film. It was however, a probable factor for fast degradation of devices using this structure. (c) 2005 Elsevier B.V. All rights reserved.
Added by: Florent Boucher  
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