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Obraztsova, E. A., Osadchy, A. V., Obraztsova, E. D., Lefrant, S. & Yaminsky, I. V. (2008) Statistical analysis of atomic force microscopy and Raman spectroscopy data for estimation of graphene layer numbers. Phys. Status Solidi B-Basic Solid State Phys. 245 2055–2059. 
Added by: Laurent Cournède (2016-03-10 21:58:41)
Type de référence: Article
DOI: 10.1002/pssb.200879657
Numéro d'identification (ISBN etc.): 0370-1972
Clé BibTeX: Obraztsova2008
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Catégories: PMN
Mots-clés: disorder, films, graphite
Créateurs: Lefrant, Obraztsova, Obraztsova, Osadchy, Yaminsky
Collection: Phys. Status Solidi B-Basic Solid State Phys.
Consultations : 2/426
Indice de consultation : 2%
Indice de popularité : 0.5%
Résumé     
In this work we present the results on preparation and analysis of structural and electronic properties of graphene flakes with different number of layers. Since the material electronic properties depend strongly on the layer number, a simple and reliable way to estimate this parameter should be found. In this work we propose to perform a quantitative analysis based on the atomic force microscopy (AFM) which was exploited by another authors rather as an illustrative technique. The graphene flakes were prepared by a micromechanical cleavage of highly oriented pyrolytic graphite (HOPG). Numerous flakes have been studied with AFM in order to estimate the number of graphene layers in each of them. The thickness distribution over the individual graphene flake, averaged over the all flakes investigated, has exhibited a row of maxima: 0.7 nm, 1.1 nm, 1.4 nm, 1.7 nm, 2.1 nm, etc. These values correspond perfectly to the one-, two, three-, and etc layers of graphene. The flakes characterized by AIM were studied afterwards with a two-phonon Raman spectroscopy. This method is known to be sensitive to the number of layers due to a "double resonance" mechanism. To interpret the Raman spectra the electronic structure of the graphene flakes of different thickness has been calculated using the density functional method. A perfect correspondence between the number of graphene layers in different flakes measured by AFM and by Raman techniques has been obtained. This demonstrates a possibility to estimate correctly the graphene layer number using the atomic force microscopy supplied with the statistical analysis. (C) 2008 WILEY-VCH Verlag GmbH \& Co. KGaA, Weinheim
Added by: Laurent Cournède  
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