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Kanaan, H., Jolinat, P., Ablart, G., Destruel, P., Renaud, C., Lee, C. W. & Nguyen, T.-P. (2010) Influence of poly (3,4-ethylenedioxythiophene)-poly (styrenesulfonate) in polyfluorene-based light-emitting diodes: Evidence of charge trapping at the organic interface. Org. Electron. 11 1047–1052. 
Added by: Laurent Cournède (2016-03-10 21:37:32)
Type de référence: Article
DOI: 10.1016/j.orgel.2010.03.003
Numéro d'identification (ISBN etc.): 1566-1199
Clé BibTeX: Kanaan2010
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Catégories: PMN
Mots-clés: Electroabsorption, electroabsorption spectroscopy, Interface, pedot:pss, Polyfluorene derivatives, thermally stimulated currents, Traps
Créateurs: Ablart, Destruel, Jolinat, Kanaan, Lee, Nguyen, Renaud
Collection: Org. Electron.
Consultations : 1/528
Indice de consultation : 4%
Indice de popularité : 1%
Résumé     
Although the improvement of the indium tin oxide (ITO) anode by PEDOT:PSS has often been reported in literature, the origin of it is not well known. In this paper, we investigate polyfluorene-based devices with a relatively high work function (Al) cathode by electroabsorption (EA) spectroscopy and thermally stimulated current (TSC) techniques. A 0.9 V increase of built-in voltage evidenced by EA in PFV-based devices was similar to that obtained previously in PFO-based devices. It was inconsistent with the work function difference between ITO (4.9 eV) and PEDOT:PSS (5.2 eV). The formation of new types of traps related to the presence of the PEDOT: PSS layer was detected by TSC in PF-N-Ph based devices, confirming that the PEDOT: PSS/PF contact layer acts as an electron trapping surface. We conclude that the TSC technique should allow a deeper characterization of charge traps created at the electrodes and a better modelling of charge injection in future studies. (C) 2010 Elsevier B.V. All rights reserved.
Added by: Laurent Cournède  
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