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Miska, P., Dossot, M., Nguyen, T. D., Gruen, M., Rinnert, H., Vergnat, M. & Humbert, B. (2010) Embedded Silicon Nanocrystals Studied by Photoluminescence and Raman Spectroscopies: Exciton and Phonon Confinement Effects. J. Phys. Chem. C, 114 17344–17349.
Added by: Laurent Cournède (2016-03-10 21:37:31) |
| Type de référence: Article DOI: 10.1021/jp1044095 Numéro d'identification (ISBN etc.): 1932-7447 Clé BibTeX: Miska2010 Voir tous les détails bibliographiques  |
Catégories: PMN Mots-clés: dependence, films, Luminescence, microstructure, nanoclusters, optical-properties, porous silicon, size Créateurs: Dossot, Gruen, Humbert, Miska, Nguyen, Rinnert, Vergnat Collection: J. Phys. Chem. C |
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Indice de consultation : 7% Indice de popularité : 1.75% |
| Résumé |
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The optical and vibrational properties of silicon nanocrystals arc studied in two systems elaborated by evaporation. The first one is constituted by a thick SiO layers. The second one is a multilayered sample made by successive evaporations of SiO and SiO(2) layers with controlled thicknesses. The luminescence and Raman spectra are fitted by phenomenological exciton and phonon confinement models accounting for the size distribution of the embedded nanocrystals. The coherence between the two models and experimental data is demonstrated and gives support to the notion of exciton and phonon confinement effect in silicon nanocrystals embedded within silica matrix.
Added by: Laurent Cournède |