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Miska, P., Dossot, M., Nguyen, T. D., Gruen, M., Rinnert, H., Vergnat, M. & Humbert, B. (2010) Embedded Silicon Nanocrystals Studied by Photoluminescence and Raman Spectroscopies: Exciton and Phonon Confinement Effects. J. Phys. Chem. C, 114 17344–17349. 
Added by: Laurent Cournède (2016-03-10 21:37:31)
Type de référence: Article
DOI: 10.1021/jp1044095
Numéro d'identification (ISBN etc.): 1932-7447
Clé BibTeX: Miska2010
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Catégories: PMN
Mots-clés: dependence, films, Luminescence, microstructure, nanoclusters, optical-properties, porous silicon, size
Créateurs: Dossot, Gruen, Humbert, Miska, Nguyen, Rinnert, Vergnat
Collection: J. Phys. Chem. C
Consultations : 18/674
Indice de consultation : 3%
Indice de popularité : 0.75%
Résumé     
The optical and vibrational properties of silicon nanocrystals arc studied in two systems elaborated by evaporation. The first one is constituted by a thick SiO layers. The second one is a multilayered sample made by successive evaporations of SiO and SiO(2) layers with controlled thicknesses. The luminescence and Raman spectra are fitted by phenomenological exciton and phonon confinement models accounting for the size distribution of the embedded nanocrystals. The coherence between the two models and experimental data is demonstrated and gives support to the notion of exciton and phonon confinement effect in silicon nanocrystals embedded within silica matrix.
Added by: Laurent Cournède  
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