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Guttmann, P., Bittencourt, C., Rehbein, S., Umek, P., Ke, X., Van Tendeloo, G., Ewels, C. P. & Schneider, G. (2012) Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM. Nat. Photonics, 6 25–29. 
Added by: Laurent Cournède (2016-03-10 21:28:40)
Type de référence: Article
DOI: 10.1038/NPHOTON.2011.268
Numéro d'identification (ISBN etc.): 1749-4885
Clé BibTeX: Guttmann2012
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Catégories: PMN
Mots-clés: absorption, carbon nanotubes, energy-loss spectroscopy, microscopy, morphology, nanoribbons, performance, spatial-resolution, titanium-dioxide, voltage
Créateurs: Bittencourt, Ewels, Guttmann, Ke, Rehbein, Schneider, Umek, Van Tendeloo
Collection: Nat. Photonics
Consultations : 9/451
Indice de consultation : 1%
Indice de popularité : 0.25%
Résumé     
Near-edge X-ray absorption spectroscopy (NEXAFS)(1) is an essential analytical tool in material science. Combining NEXAFS with scanning transmission X-ray microscopy (STXM) adds spatial resolution and the possibility to study individual nanostructures(2,3). Here, we describe a full-field transmission X-ray microscope (TXM) that generates high-resolution, large-area NEXAFS data with a collection rate two orders of magnitude faster than is possible with STXM. The TXM optical design combines a spectral resolution of E/Delta E = 1 x 10(4) with a spatial resolution of 25 nm in a field of view of 15-20 mu m and a data acquisition time of similar to 1 s. As an example, we present image stacks and polarization-dependent NEXAFS spectra from individual anisotropic sodium and protonated titanate nanoribbons. Our NEXAFS-TXM technique has the advantage that one image stack visualizes a large number of nanostructures and therefore already contains statistical information. This new high-resolution NEXAFS-TXM technique opens the way to advanced nanoscale science studies.
Added by: Laurent Cournède  
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