IMN

Biblio. IMN

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Aissa, A. K., Achour, A., Camus, J., Le Brizoual, L., Jouan, P. .-Y. & Djouadi, M. .-A. (2014) Comparison of the structural properties and residual stress of AlN films deposited by dc magnetron sputtering and high power impulse magnetron sputtering at different working pressures. Thin Solid Films, 550 264–267.   
Added by: Florent Boucher 2016-04-29 09:26:45 Pop. 1.5%
Hatte, Q., Richard-Plouet, M., Jouan, P.-Y., Casari, P. & Dubos, P.-A. (2021) Simple and Versatile Analytical Method for Monitoring the Deposition of Thin Layers by Optical Measurement and Calculation of Residual Stress. Thin Solid Films, 725.   
Last edited by: Richard Baschera 2021-06-03 10:22:07 Pop. 2%
Théodore, J., Couturier, L., Girault, B., Cabeza, S., Pirling, T., Frapier, R., Bazin, G. & Courant, B. (2023) Relationship between microstructure, and residual strain and stress in stainless steels in-situ alloyed by double-wire arc additive manufacturing (D-WAAM) process. Materialia, 30 101850.   
Last edited by: Richard Baschera 2023-09-22 10:16:40 Pop. 7.25%
Tranchant, J., Tessier, P. Y., Landesman, J. P., Djouadi, M. A., Angleraud, B., Renault, P. O., Girault, B. & Goudeau, P. (2008) Relation between residual stresses and microstructure in Mo(Cr) thin films elaborated by ionized magnetron sputtering. Surf. Coat. Technol. 202 2247–2251.   
Added by: Laurent Cournède 2016-03-10 21:58:42 Pop. 1.5%
wikindx 4.2.2 ©2014 | Références totales : 2830 | Requêtes métadonnées : 42 | Exécution de script : 0.09208 secs | Style : Harvard | Bibliographie : Bibliographie WIKINDX globale