| Achour, A., Soussou, M. A., Aissa, A. K., Islam, M., Barreau, N., Faulques, E., Le Brizoual, L., Djouadi, M. A. & Boujtita, M. (2014) Nanostructuration and band gap emission enhancement of ZnO film via electrochemical anodization. Thin Solid Films, 571 168–174. |
|
| Added by: Laurent Cournède 2016-03-10 21:01:54 |
Pop. 1.5%
|
| Achour, A., Aissa, A. K., Mbarek, M., El Hadj, K., Ouldhamadouche, N., Barreau, N., Le Brizoual, L. & Djouadi, M. A. (2013) Enhancement of near-band edge photoluminescence of ZnO film buffered with TiN. Thin Solid Films, 538 71–77. |
|
| Added by: Laurent Cournède 2016-03-10 21:23:30 |
Pop. 1.75%
|
| Bargiela, P., Fernandez, V., Morgan, D., Fairley, N. & Baltrusaitis, J. (2024) Surface science insight note: A linear algebraic approach to elucidate native films on Fe3O4 surface. Surface and Interface Analysis, 56 189–199. |
|
| Last edited by: Richard Baschera 2024-04-16 07:45:21 |
Pop. 0%
|
| Bargiela, P., Fernandez, V., Ravisy, W., Morgan, D., Richard-Plouet, M., Fairley, N. & Baltrusaitis, J. (2024) Surface Analysis Insight Note: Observations relating to photoemission peak shapes, oxidation state, and chemistry of titanium oxide films. Surface and Interface Analysis, |
|
| Last edited by: Richard Baschera 2024-01-19 15:15:54 |
Pop. 0.5%
|
| Bargiela, P., Fernandez, V., Cardinaud, C., Walton, J., Greiner, M., Morgan, D., Fairley, N. & Baltrusaitis, J. (2021) Towards a reliable assessment of charging effects during surface analysis: Accurate spectral shapes of ZrO2 and Pd/ZrO2 via X-ray Photoelectron Spectroscopy. Applied Surface Science, 566 150728. |
|
| Last edited by: Richard Baschera 2021-09-27 09:03:37 |
Pop. 1.25%
|
| Bulusheva, L. G., Lobiak, E., Fedoseeva, Y., Mevellec, J. .-Y., Makarova, A. A., Flahaut, E. & Okotrub, A. (2020) Effect of ultrasound pretreatment on bromination of double-walled carbon nanotubes. Synth. Met. 259 116233. |
|
| Last edited by: Richard Baschera 2020-02-24 16:54:40 |
Pop. 1.5%
|
| Fairley, N., Fernandez, V., Richard‐Plouet, M., Guillot-Deudon, C., Walton, J., Smith, E., Flahaut, D., Greiner, M., Biesinger, M., Tougaard, S., Morgan, D. & Baltrusaitis, J. (2021) Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy. Applied Surface Science Advances, 5 100112. |
|
| Last edited by: Richard Baschera 2021-10-14 13:12:04 |
Pop. 2%
|
| Fedoseeva, Y. V., Bulusheva, L. G., Koroteev, V. O., Mevellec, J. .-Y., Senkovskiy, B. V., Flahaut, E. & Okotrub, A. V. (2020) Preferred attachment of fluorine near oxygen-containing groups on the surface of double-walled carbon nanotubes. Appl. Surf. Sci. 504 144357. |
|
| Last edited by: Richard Baschera 2020-01-10 16:15:13 |
Pop. 1%
|
| Fernandez, V., Renault, O., Fairley, N. & Baltrusaitis, J. (2024) Surface science insight note: Optimizing XPS instrument performance for quantification of spectra. Surface and Interface Analysis, n/a. |
|
| Last edited by: Richard Baschera 2024-04-16 08:30:30 |
Pop. 0%
|
| Keraudy, J., Ferrec, A., Richard-Plouet, M., Hamon, J., Goullet, A. & Jouan, P.-Y. (2017) Nitrogen doping on NiO by reactive magnetron sputtering: A new pathway to dynamically tune the optical and electrical properties. Appl. Surf. Sci. 409 77–84. |
|
| Last edited by: Richard Baschera 2017-06-20 15:27:41 |
Pop. 1.25%
|
| Moeini, B., Linford, M. R., Fairley, N., Barlow, A., Cumpson, P., Morgan, D., Fernandez, V. & Baltrusaitis, J. (2021) Definition of a new (Doniach-Sunjic-Shirley) peak shape for fitting asymmetric signals applied to reduced graphene oxide/graphene oxide XPS spectra. Surface and Interface Analysis, n/a. |
|
| Last edited by: Richard Baschera 2021-11-04 14:42:28 |
Pop. 2.25%
|
| Moeini, B., Haack, H., Fairley, N., Fernandez, V., Gengenbach, T. R., Easton, C. D. & Linford, M. R. (2021) Box plots: A simple graphical tool for visualizing overfitting in peak fitting as demonstrated with X-ray photoelectron spectroscopy data. Journal of Electron Spectroscopy and Related Phenomena, 250 147094. |
|
| Last edited by: Richard Baschera 2021-07-23 13:50:35 |
Pop. 2.25%
|
| Rouahi, A., Challali, F., Dakhlaoui, I., Vallee, C., Salimy, S., Jomni, F., Yangui, B., Besland, M. P., Goullet, A. & Sylvestre, A. (2016) Structural and dielectric characterization of sputtered Tantalum Titanium Oxide thin films for high temperature capacitor applications. Thin Solid Films, 606 127–132. |
|
| Last edited by: Richard Baschera 2016-06-03 13:58:09 |
Pop. 1%
|
