Besland, M. P., Borderon, C., Cavellier, M., Le Tacon, S., Richard-Plouet, M., Albertini, D., Averty, D., Tessier, P. Y., Gundel, H. W., Brohan, L. & Djouadi, M. A. (2007) Two step reactive magnetron sputtering of BLT thin films. Integr. Ferroelectr. 94 94–104. |
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Besland, M. P., Aissa, H. D. A., Barroy, P. R. J., Lafane, S., Tessier, P. Y., Angleraud, B., Richard-Plouet, M., Brohan, L. & Djouadi, M. A. (2006) Comparison of lanthanum substituted bismuth titanate (BLT) thin films deposited by sputtering and pulsed laser deposition. Thin Solid Films, 495 86–91. |
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Added by: Florent Boucher 2016-05-12 13:21:38 |
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Besland, M. P., Borderon, C., Barroy, P. R. J., Le Tacon, S., Richard-Plouet, M., Averty, D., Tessier, P. Y., Gundel, H. W., Brohan, L. & Djouadi, M. A. (2008) Improvement of dielectric properties of BLT thin films deposited by magnetron sputtering - art. no. 012006. Finnis, M. W., Hoffmann, M. J. & GautierSoyer, M. (Eds.), Interfacial Nanostructures in Ceramics: A Multiscale Approach Bristol. |
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Gautron, E., Buffiere, M., Harel, S., Assmann, L., Arzel, L., Brohan, L., Kessler, J. & Barreau, N. (2013) Microstructural characterization of chemical bath deposited and sputtered Zn(O,S) buffer layers. Thin Solid Films, 535 175–179. |
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Karpinski, A., Ferrec, A., Richard-Plouet, M., Cattin, L., Djouadi, M. A., Brohan, L. & Jouan, P. .-Y. (2012) Deposition of nickel oxide by direct current reactive sputtering Effect of oxygen partial pressure. Thin Solid Films, 520 3609–3613. |
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Added by: Laurent Cournède 2016-03-10 21:28:40 |
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Karpinski, A., Ouldhamadouche, N., Ferrec, A., Cattin, L., Richard-Plouet, M., Brohan, L., Djouadi, M. A. & Jouan, P. .-Y. (2011) Optical characterization of transparent nickel oxide films deposited by. Thin Solid Films, 519 5767–5770. |
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Liu, C. E., Richard-Plouet, M., Albertini, D., Besland, M. P. & Brohan, L. (2008) Bi3.25La0.75Ti3O12 films on La2Ti2O7 thin films prepared by chemical solution deposition - art. no. 012014. Finnis, M. W., Hoffmann, M. J. & GautierSoyer, M. (Eds.), Interfacial Nanostructures in Ceramics: A Multiscale Approach Bristol. |
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Nguyen, D. T., Ferrec, A., Keraudy, J., Richard-Plouet, M., Goullet, A., Cattin, L., Brohan, L. & Jouan, P. .-Y. (2014) Ellipsometric and XPS characterization of transparent nickel oxide thin films deposited by reactive HiPIMS. Surf. Coat. Technol. 250 21–25. |
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Added by: Laurent Cournède 2016-03-10 21:01:55 |
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