| Avval, T. G., Gallagher, N., Morgan, D., Bargiela, P., Fairley, N., Fernandez, V. & Linford, M. R. (2022) Practical guide on chemometrics/informatics in x-ray photoelectron spectroscopy (XPS). I. Introduction to methods useful for large or complex datasets. Journal of Vacuum Science & Technology A, 40 063206. |
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| Last edited by: Richard Baschera 2022-12-14 13:28:52 |
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| Avval, T. G., Moeini, B., Carver, V., Fairley, N., Smith, E. F., Baltrusaitis, J., Fernandez, V., Tyler, Bonnie. J., Gallagher, N. & Linford, M. R. (2021) The Often-Overlooked Power of Summary Statistics in Exploratory Data Analysis: Comparison of Pattern Recognition Entropy (PRE) to Other Summary Statistics and Introduction of Divided Spectrum-PRE (DS-PRE). J. Chem. Inf. Model. 61 4173–4189. |
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| Last edited by: Richard Baschera 2021-10-22 10:43:28 |
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| Avval, T. G., Haack, H., Gallagher, N., Morgan, D., Bargiela, P., Fairley, N., Fernandez, V. & Linford, M. R. (2022) Practical guide on chemometrics/informatics in x-ray photoelectron spectroscopy (XPS). II. Example applications of multiple methods to the degradation of cellulose and tartaric acid. Journal of Vacuum Science & Technology A, 40 063205. |
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| Last edited by: Richard Baschera 2022-12-14 13:28:05 |
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| Baltrusaitis, J., Mendoza-Sanchez, B., Fernandez, V., Veenstra, R., Dukstiene, N., Roberts, A. & Fairley, N. (2015) Generalized molybdenum oxide surface chemical state XPS determination via informed amorphous sample model. Appl. Surf. Sci. 326 151–161. |
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| Added by: Laurent Cournède 2016-03-10 18:36:42 |
Pop. 1.25%
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| Bargiela, P., Fernandez, V., Cardinaud, C., Walton, J., Greiner, M., Morgan, D., Fairley, N. & Baltrusaitis, J. (2021) Towards a reliable assessment of charging effects during surface analysis: Accurate spectral shapes of ZrO2 and Pd/ZrO2 via X-ray Photoelectron Spectroscopy. Applied Surface Science, 566 150728. |
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| Last edited by: Richard Baschera 2021-09-27 09:03:37 |
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| Bargiela, P., Fernandez, V., Ravisy, W., Morgan, D., Richard-Plouet, M., Fairley, N. & Baltrusaitis, J. (2024) Surface Analysis Insight Note: Observations relating to photoemission peak shapes, oxidation state, and chemistry of titanium oxide films. Surface and Interface Analysis, |
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| Last edited by: Richard Baschera 2024-01-19 15:15:54 |
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| Bargiela, P., Fernandez, V., Morgan, D., Fairley, N. & Baltrusaitis, J. (2024) Surface science insight note: A linear algebraic approach to elucidate native films on Fe3O4 surface. Surface and Interface Analysis, 56 189–199. |
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| Last edited by: Richard Baschera 2024-04-16 07:45:21 |
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| Bechu, S., Humbert, B., Fernandez, V., Fairley, N. & Richard-Plouet, M. (2018) Vectorial method used to monitor an evolving system: Titanium oxide thin films under UV illumination. Applied Surface Science, 447 528–534. |
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| Last edited by: Richard Baschera 2018-07-24 13:53:27 |
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| Bechu, S., Richard-Plouet, M., Fernandez, V., Walton, J. & Fairley, N. (2016) Developments in numerical treatments for large data sets of XPS images. Surf. Interface Anal. 48 301–309. |
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| Last edited by: Richard Baschera 2016-09-28 07:34:13 |
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| d'Halluin, M., Mabit, T., Fairley, N., Fernandez, V., Gawande, M. B., Le Grognec, E. & Felpin, F.-X. (2015) Graphite-supported ultra-small copper nanoparticles - Preparation, characterization and catalysis applications. Carbon, 93 974–983. |
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| Added by: Laurent Cournède 2016-03-10 18:36:41 |
Pop. 1.25%
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| Ettouri, R., Tillocher, T., Lefaucheux, P., Boutaud, B., Fernandez, V., Fairley, N., Cardinaud, C., Girard, A. & Dussart, R. (2022) Combined analysis methods for investigating titanium and nickel surface contamination after plasma deep etching. Surface and Interface Analysis, 54 134. |
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| Last edited by: Richard Baschera 2022-06-16 09:27:17 |
Pop. 2.5%
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| Fairley, N., Fernandez, V., Richard‐Plouet, M., Guillot-Deudon, C., Walton, J., Smith, E., Flahaut, D., Greiner, M., Biesinger, M., Tougaard, S., Morgan, D. & Baltrusaitis, J. (2021) Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy. Applied Surface Science Advances, 5 100112. |
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| Last edited by: Richard Baschera 2021-10-14 13:12:04 |
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| Fairley, N., Bargiela, P., Roberts, A., Fernandez, V. & Baltrusaitis, J. (2023) Practical guide to understanding goodness-of-fit metrics used in chemical state modeling of x-ray photoelectron spectroscopy data by synthetic line shapes using nylon as an example. Journal of Vacuum Science & Technology A, 41 013203. |
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| Last edited by: Richard Baschera 2023-01-20 09:57:54 |
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| Fernandez, V., Renault, O., Fairley, N. & Baltrusaitis, J. (2024) Surface science insight note: Optimizing XPS instrument performance for quantification of spectra. Surface and Interface Analysis, n/a. |
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| Last edited by: Richard Baschera 2024-04-16 08:30:30 |
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| Fernandez, V., Fairley, N. & Baltrusaitis, J. (2023) Surface analysis insight note: Synthetic line shapes, integration regions and relative sensitivity factors. Surface and Interface Analysis, 55 3–9. |
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| Last edited by: Richard Baschera 2023-11-22 18:05:50 |
Pop. 1.75%
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| Fernandez, V., Fairley, N. & Baltrusaitis, J. (2021) Unraveling spectral shapes of adventitious carbon on gold using a time-resolved high-resolution X-ray photoelectron spectroscopy and principal component analysis. Applied Surface Science, 538 148031. |
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| Last edited by: Richard Baschera 2021-01-11 08:51:09 |
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| Fernandez, V., Kiani, D., Fairley, N., Felpin, F.-X. & Baltrusaitis, J. (2020) Curve fitting complex X-ray photoelectron spectra of graphite-supported copper nanoparticles using informed line shapes. Appl. Surf. Sci. 505 143841. |
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| Last edited by: Richard Baschera 2020-03-13 15:03:23 |
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| Fernandez, V., Morgan, D., Bargiela, P., Fairley, N. & Baltrusaitis, J. (2023) Combining PCA and nonlinear fitting of peak models to re-evaluate C 1s XPS spectrum of cellulose. Applied Surface Science, 614 156182. |
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| Last edited by: Richard Baschera 2023-05-19 08:29:01 |
Pop. 3.5%
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| Grissa, R., Fernandez, V., Fairley, N., Hamon, J., Stephant, N., Rolland, J., Bouchet, R., Lecuyer, M., Deschamps, M., Guyomard, D. & Moreau, P. (2018) XPS and SEM-EDX Study of Electrolyte Nature Effect on Li Electrode in Lithium Metal Batteries. Acs Applied Energy Materials, 1 5694–5702. |
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| Last edited by: Richard Baschera 2019-03-26 10:23:27 |
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| Lizarbe, A. J., Major, G. H., Fernandez, V., Fairley, N. & Linford, M. R. (2023) Insight note: X-ray photoelectron spectroscopy (XPS) peak fitting of the Al 2p peak from electrically isolated aluminum foil with an oxide layer. Surface and Interface Analysis, 55 651–657. |
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| Last edited by: Richard Baschera 2023-08-17 12:52:21 |
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| Major, G. H., Fairley, N., Sherwood, P. M. A., Linford, M. R., Terry, J., Fernandez, V. & Artyushkova, K. (2020) Practical guide for curve fitting in x-ray photoelectron spectroscopy. Journal of Vacuum Science & Technology A, 38 061203. |
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| Last edited by: Richard Baschera 2020-11-17 13:22:05 |
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| Major, G. H., Fernandez, V., Fairley, N., Smith, E. F. & Linford, M. R. (2022) Guide to XPS data analysis: Applying appropriate constraints to synthetic peaks in XPS peak fitting. Journal of Vacuum Science & Technology A, 40. |
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| Last edited by: Richard Baschera 2022-11-14 10:07:58 |
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| Major, G. H., Fernandez, V., Fairley, N. & Linford, M. R. (2021) A detailed view of the Gaussian-Lorentzian sum and product functions and their comparison with the Voigt function. Surface and Interface Analysis, n/a 1334. |
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| Last edited by: Richard Baschera 2021-12-23 11:12:19 |
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| Moeini, B., Linford, M. R., Fairley, N., Barlow, A., Cumpson, P., Morgan, D., Fernandez, V. & Baltrusaitis, J. (2021) Definition of a new (Doniach-Sunjic-Shirley) peak shape for fitting asymmetric signals applied to reduced graphene oxide/graphene oxide XPS spectra. Surface and Interface Analysis, n/a. |
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| Last edited by: Richard Baschera 2021-11-04 14:42:28 |
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| Moeini, B., Haack, H., Fairley, N., Fernandez, V., Gengenbach, T. R., Easton, C. D. & Linford, M. R. (2021) Box plots: A simple graphical tool for visualizing overfitting in peak fitting as demonstrated with X-ray photoelectron spectroscopy data. Journal of Electron Spectroscopy and Related Phenomena, 250 147094. |
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| Last edited by: Richard Baschera 2021-07-23 13:50:35 |
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| Unger, W. E. S., Senoner, M., Stockmann, J. M., Fernandez, V., Fairley, N., Passiu, C., Spencer, N. D. & Rossi, A. (2021) Summary of ISO/TC 201 International Standard ISO 18516:2019 Surface chemical analysis-Determination of lateral resolution and sharpness in beam-based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X-ray photoelectron spectrometers (XPS). Surface and Interface Analysis, |
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| Last edited by: Richard Baschera 2021-11-04 14:41:19 |
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