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Ettouri, R., Tillocher, T., Lefaucheux, P., Boutaud, B., Fernandez, V., Fairley, N., Cardinaud, C., Girard, A. & Dussart, R. (2022) Combined analysis methods for investigating titanium and nickel surface contamination after plasma deep etching. Surface and Interface Analysis, 54 134.   
Last edited by: Richard Baschera 2022-06-16 09:27:17 Pop. 2.75%
Fernandez, V., Fairley, N. & Baltrusaitis, J. (2022) Surface analysis insight note: Synthetic line shapes, integration regions and relative sensitivity factors. Surface and Interface Analysis,   
Last edited by: Richard Baschera 2022-10-28 09:24:17 Pop. 1.25%
Major, G. H., Fernandez, V., Fairley, N. & Linford, M. R. (2021) A detailed view of the Gaussian-Lorentzian sum and product functions and their comparison with the Voigt function. Surface and Interface Analysis, n/a 1334.   
Last edited by: Richard Baschera 2021-12-23 11:12:19 Pop. 3.5%
Major, G. H., Avval, T. G., Patel, D. I., Shah, D., Roychowdhury, T., Barlow, A. J., Pigram, P. J., Greiner, M., Fernandez, V., Herrera-Gomez, A. & Linford, M. R. (2021) A discussion of approaches for fitting asymmetric signals in X-ray photoelectron spectroscopy (XPS), noting the importance of Voigt-like peak shapes. Surface and Interface Analysis, n/a.   
Last edited by: Richard Baschera 2021-06-17 07:22:52 Pop. 2%
Moeini, B., Linford, M. R., Fairley, N., Barlow, A., Cumpson, P., Morgan, D., Fernandez, V. & Baltrusaitis, J. (2021) Definition of a new (Doniach-Sunjic-Shirley) peak shape for fitting asymmetric signals applied to reduced graphene oxide/graphene oxide XPS spectra. Surface and Interface Analysis, n/a.   
Last edited by: Richard Baschera 2021-11-04 14:42:28 Pop. 2.25%
Unger, W. E. S., Senoner, M., Stockmann, J. M., Fernandez, V., Fairley, N., Passiu, C., Spencer, N. D. & Rossi, A. (2021) Summary of ISO/TC 201 International Standard ISO 18516:2019 Surface chemical analysis-Determination of lateral resolution and sharpness in beam-based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X-ray photoelectron spectrometers (XPS). Surface and Interface Analysis,   
Last edited by: Richard Baschera 2021-11-04 14:41:19 Pop. 2.5%
wikindx 4.2.2 ©2014 | Références totales : 2741 | Requêtes métadonnées : 53 | Exécution de script : 0.09404 secs | Style : Harvard | Bibliographie : Bibliographie WIKINDX globale