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Fernandez, V., Renault, O., Fairley, N. & Baltrusaitis, J. (2024) Surface science insight note: Optimizing XPS instrument performance for quantification of spectra. Surface and Interface Analysis, n/a. |
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Lizarbe, A. J., Major, G. H., Fernandez, V., Fairley, N. & Linford, M. R. (2023) Insight note: X-ray photoelectron spectroscopy (XPS) peak fitting of the Al 2p peak from electrically isolated aluminum foil with an oxide layer. Surface and Interface Analysis, 55 651–657. |
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Last edited by: Richard Baschera 2023-08-17 12:52:21 |
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Major, G. H., Fernandez, V., Fairley, N. & Linford, M. R. (2021) A detailed view of the Gaussian-Lorentzian sum and product functions and their comparison with the Voigt function. Surface and Interface Analysis, n/a 1334. |
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Major, G. H., Avval, T. G., Patel, D. I., Shah, D., Roychowdhury, T., Barlow, A. J., Pigram, P. J., Greiner, M., Fernandez, V., Herrera-Gomez, A. & Linford, M. R. (2021) A discussion of approaches for fitting asymmetric signals in X-ray photoelectron spectroscopy (XPS), noting the importance of Voigt-like peak shapes. Surface and Interface Analysis, n/a. |
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Last edited by: Richard Baschera 2021-06-17 07:22:52 |
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Moeini, B., Linford, M. R., Fairley, N., Barlow, A., Cumpson, P., Morgan, D., Fernandez, V. & Baltrusaitis, J. (2021) Definition of a new (Doniach-Sunjic-Shirley) peak shape for fitting asymmetric signals applied to reduced graphene oxide/graphene oxide XPS spectra. Surface and Interface Analysis, n/a. |
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Unger, W. E. S., Senoner, M., Stockmann, J. M., Fernandez, V., Fairley, N., Passiu, C., Spencer, N. D. & Rossi, A. (2021) Summary of ISO/TC 201 International Standard ISO 18516:2019 Surface chemical analysis-Determination of lateral resolution and sharpness in beam-based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X-ray photoelectron spectrometers (XPS). Surface and Interface Analysis, |
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